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Automation Test Video
Accelerate Product Ramp with TetraMAX ATPG and Yield Explorer
Girish Patankar discusses diagnostics in TetraMAX ATPG, accuracy improvements with physical diagnostics, and how TetraMAX ATPG and Yield Explorer form a complete solution for volume diagnostics.
Girish Patankar, Sr. R&D Manager
Product Information
DFTMAX Compression Datasheet
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Using TetraMAX® Physical Diagnostics for Advanced Yield Analysis
Design Compiler 2010 Video
Introducing What's new in Design Compiler
CUSTOMERS COMMENT
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NEW! DESIGN COMPILER 2010
Doubles productivity of synthesis and place & route
Design Compiler 2010 Demo
Identify and fix floorplan issues in synthesis
View Point EETimes
RTL synthesis can accelerate the entire implementation flow
News
Synopsys DFTMAX Compression Cuts Pin-Limited Test Cost by 95 Percent at Silicon Image
Synopsys Galaxy Implementation Platform Used by TSMC for 28nm Process
Synopsys' Design Compiler Graphical Shortens Design Schedule at Oticon
Samsung Achieves First-Pass 32nm Silicon Success Using Synopsys Galaxy....
Design Compiler 2010 Doubles Productivity of Synthesis and Place and Route
Yamaha Tapes Out Their Latest Graphics LSI Chip with Synopsys Design Compiler....
Synopsys TetraMAX ATPG Cuts Test Development Schedule at Arrow Electronics
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Small Delay Defect Testing
Flexible Analysis is Key to Power Integrity
Accellera Rolls Power Plan
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Optimizing Compression in Scan-based ATPG DFT Implementations
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Design Compiler 2010
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Synopsys and LG Electronics
Synopsys and Progate
Synopsys and PLX Technology
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White Papers
Faster Design Convergence with Design Compiler 2010
Testing Low Power Designs with Power Aware Test
Maximizing Leakage Savings with DC 2010.03
Using TetraMAX® Physical Diagnostics for Advanced Yield Analysis
Multicore and Distributed Processing With TetraMAX® ATPG
Techniques for Achieving Higher Completion in Formality®
Maximizing RTL Designer Productivity for Implementation Design-for-Test
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Webinars
Utilizing Design Compiler 2010 Technologies
New Enhancements for Debugging in Formality
Static Verification for Low Power Design
Reducing the Cost of Pin-Limited Test
Design Compiler 2010
Power-Aware and Small Delay Defect Testing
Equivalence Checking of DC Ultra Designs
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Videos
Accelerate Product Ramp with TetraMAX ATPG and Yield Explorer
Galaxy Test 2010.03 Introduction
Pin-Limited Test
Design Compiler 2010 Video
Power-Aware Test
Small Delay Defects: The Need for Better At-Speed Tests
Perspective: Boost your design productivity
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